Date and time:
Venue: 10.08.04
Chair: Xiaodong Li
Abstract:
Recently, we have proposed to improve the fault-detection capability of random
testing by enforcing a more even, well-spread distribution of test cases over
the input domain. Such an approach is named as adaptive random testing. In this seminar, we will cover
1. the
motivation;
2. failure
pattern based testing;
3. various
principles that could enforce an even spread of test cases, and the advantages and
disadvantages of their corresponding
4. comparison of random testing and adaptive random testing with respect to various testing effectiveness measures.
About the speaker:
Dr. T. Y. Chen obtained his BSc and MPhil. from the
Seminar Organisation
Seminars are free and open to the general public. No booking is necessary. If you are interested in giving a presentation in this seminar series, or to make suggestions for speakers, please contact Xiaodong Li, the seminar co-ordinator.